{"version":"1.0","type":"link","title":"Design for testing - Newikis","description":"Design for testing or design for testability (DFT) consists of integrated circuit design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is…","provider_name":"Newikis","provider_url":"https://newikis.com","cache_age":86400}