{"version":"1.0","type":"link","title":"Scan chain - Newikis","description":"Scan chain is a technique used in design for testing (DFT). The objective is to make testing easier by providing a simple way to set and observe every flip-flop in an IC. It simplifies the testing and debugging of complex digital systems. In scan-based design, flip-flops operate in two distinct…","provider_name":"Newikis","provider_url":"https://newikis.com","cache_age":86400,"thumbnail_url":"https://upload.wikimedia.org/wikipedia/commons/1/10/Scan_Chain.jpg","thumbnail_width":911,"thumbnail_height":481}